Description
The TF-VIS System has a thickness measurment range from 150A-20um and spectral range from 400-1000nm. StellarNet thin film reflectometry systems consist of a portable USBspectrometer coupled to a reflectance probe and light source. The optical properties are obtained from reflection and thickness is measured by detecting the sinusoidal fringe pattern from the sample's specular reflectance. Several spectrometer models are available to suit your thin film and/or optical measurement requirements.
Visit our Thin Fiilm Webpage for infromation about our other systems. StellarNet Thin-Film Webpage
Other available systems below in grey.
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* Special offer, only available online
| Precision | 0.1Å or 0.01% (greater of) | Standard deviation of 100 thickness reading of 100nm SiO2/Si calibration sample |
| Accuracy | 0.2% or 10A (greater of) | Film stack dependent |
| Stability | 0.2A or 0.02% (greater of) | 2 sigma over 20 days (100 measurements daily) on 100nm/Si calibration sample |
| Spot size | 3 mm standard, optional down to 3 µm | |
| Sample size | from 1 mm | |
| Computer OS | TFC Software designed for 32-bit OS | Upgrades available |
